E. Vireton et al., SIO2-TA2O5 SPUTTERING YIELDS - SIMULATED AND EXPERIMENTAL RESULTS, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 95(1), 1995, pp. 34-40
To improve the coating of mirrors, we have modelized the sputtering of
binary oxide targets using the TRIM code. Firstly, we have proposed a
method to calculate TRIM input parameters using on the one hand the t
hermodynamic cycle and on the other hand Malherbe's results. Secondly,
an iterative processing has been provided for oxide steady targets ca
used by ionic bombardment. Thirdly, we have exposed a model to get exp
erimental sputtering yields. Fourthly, for the (Ar-SiO2) pair, we have
determined that the steady target is a silica one. A good agreement b
etween simulated and experimental yields versus ion incident angle has
been found. For the (Ar-Ta2O5) pair, we have to introduce the prefere
ntial sputtering concept to explain the discrepancy between simulation
and experiment. In this case, the steady target is tantalum monoxide.
For the (Ar-Ta(+O-2)) pair, tantalum sputtered by argon ions in a rea
ctive oxygen atmosphere, we have to take into account a new concept of
oxidation stimulated by an ion beam. We have supposed that the tantal
um target becomes a Ta2O5 one in a reactive oxygen atmosphere. Then, t
he subsequent mechanism is similar to that of the previous pair. We ha
ve obtained a steady target of tantalum monoxide too. Comparison betwe
en simulated and experimental sputtering yields versus ion incident an
gle has given a very good agreement. By simulation, we have found that
the tantalum monoxide target has a thickness of at least 1.5 nm. Thes
e results are compatible with those of Malherbe and Taglauer.