As. Vedeneev et al., VERY SENSITIVE FACILITY FOR PRECISION-MEASUREMENTS OF MAGNETORESISTANCE AND THE HALL-EFFECT IN SEMICONDUCTOR STRUCTURES, Instruments and experimental techniques, 37(4), 1994, pp. 479-484
A facility for studying galvanomagnetic effects uses the two-frequency
technique and a digital phase-sensitive detection of the signal. In s
tudies of high-resistance samples (R less than or equal to 10(11) Omeg
a) the error in the Hall voltage (similar to 1 mu V) and the noise sup
pression (similar or equal to 80 dB) are controlled by the sensitivity
and resolution of the digital devices. The electron mobility in a mod
ulation doped GaAs-GaAlAs heterojunction has been derived for a wide r
ange of electron densities (three orders of magnitude) from the geomet
rical magnetoresistance as a function of the gate voltage.