INDENTATION RESPONSE OF DIAMOND THIN-FILMS

Citation
Sj. Bull et al., INDENTATION RESPONSE OF DIAMOND THIN-FILMS, DIAMOND AND RELATED MATERIALS, 4(1), 1994, pp. 43-52
Citations number
29
Categorie Soggetti
Material Science
ISSN journal
09259635
Volume
4
Issue
1
Year of publication
1994
Pages
43 - 52
Database
ISI
SICI code
0925-9635(1994)4:1<43:IRODT>2.0.ZU;2-J
Abstract
The high hardness and elastic modulus of diamond, together with its re lative chemical inertness and high thermal conductivity, make it an ex cellent candidate material for sensing applications involving exposure to extreme conditions. With the emergence of CVD diamond technology i t has become possible to deposit thin diamond films onto a range of su bstrate materials. However, it is important that reliable property mea surements be made on the coatings, a very exacting task. In this study the mechanical properties of diamond films deposited by microwave and thermal filament CVD were investigated by two indentation techniques, direct low load measurements using a nanoindenter and an indirect mod elling route using conventional Vickers indentations. The results of t he two techniques were correlated to determine the effect of the measu rement route on the mechanical properties determined. In general, the ranking of the hardness of the films deposited by the two techniques i s similar, with the microwave CVD films being considerably softer alth ough the hardness of the films does depend on the choice of process pa rameters used in each technique. The hardness of the film is dominated by the yield or fracture properties of the diamond crystal with the s mall grain size of the coatings contributing only a small proportion o f the measured hardness.