MEASUREMENT OF THE ELECTRONIC DEPHASING TIME VIA THE WEAK-LOCALIZATION EFFECT IN A NARROW CHANNEL

Citation
Ja. Katine et al., MEASUREMENT OF THE ELECTRONIC DEPHASING TIME VIA THE WEAK-LOCALIZATION EFFECT IN A NARROW CHANNEL, Superlattices and microstructures, 16(2), 1994, pp. 211-215
Citations number
10
Categorie Soggetti
Physics, Condensed Matter
ISSN journal
07496036
Volume
16
Issue
2
Year of publication
1994
Pages
211 - 215
Database
ISI
SICI code
0749-6036(1994)16:2<211:MOTEDT>2.0.ZU;2-J
Abstract
We have utilized the the weak localization effect in a narrow channel to measure the phase coherence time tau(phi) at temperatures between 0 .42 K and 4.25 K for electrons in a two-dimensional electron gas forme d in a GaAs/AlxGa1-xAs heterostructure. The measured values agree well with electron-electron scattering theory in a one-dimensional channel including both single particle and collective contributions.