Bg. Markey et al., DLTS STUDY OF A SEEDED PHYSICAL VAPOR TRANSPORT ZNSE SCHOTTKY DIODE, Physica status solidi. a, Applied research, 146(2), 1994, pp. 735-743
Deep level characterization of a ZnSe Schottky diode grown by the seed
ed physical vapor transport (SPVT) method is presented for the first t
ime. Deep level transient spectroscopy (DLTS) measurements reveal a de
ep electron trapping level with an activation energy of(0.34 +/- 0.01)
eV and a concentration of 1.01 x 10(12) cm(-3). Through the use of sh
ort fill pulses and curve fitting, several lower concentration peaks a
re also characterized. These are found to have concentrations on the o
rder of 10(10) to 10(11) cm(-3) and activation energies ranging from 0
.096 to 0.383 eV.