CHARACTERIZATION OF RECONSTRUCTED SIC(100) SURFACES USING SOFT-X-RAY PHOTOEMISSION SPECTROSCOPY

Authors
BERMUDEZ VM LONG JP
Citation
Vm. Bermudez et Jp. Long, CHARACTERIZATION OF RECONSTRUCTED SIC(100) SURFACES USING SOFT-X-RAY PHOTOEMISSION SPECTROSCOPY, Applied physics letters, 66(4), 1995, pp. 475-477
Citations number
27
Categorie Soggetti
Physics, Applied
Journal title
Applied physics letters → ACNP
ISSN journal
00036951
Volume
66
Issue
4
Year of publication
1995
Pages
475 - 477
Database
ISI
SICI code
0003-6951(1995)66:4<475:CORSSU>2.0.ZU;2-Y