In this paper, the Monte Carlo method is applied to uniform and n(+) -
n(-) - n(+) structures of silicon to study the behavior of tail elect
rons and to develop a new set of hydrodynamic equations based on tail
electron statistics. Each term in these equations is calibrated under
both nonhomogeneous and homogeneous electric fields. Terms associated
with surface integral of the carriers and carrier momentum over an iso
energy surface (E = E(th)) are introduced. The new tail electron hydr
odynamic model yields the density (n(2)) and the average energy (w(2))
of tail electrons and is shown to predict hot electron effects accura
tely.