A combined laser-plasma-etching technique has been investigated for ut
ilizing diamond-like carbon (DLC) films as resists in lithography. The
technique is based on the selective enhancement of O-2 plasma etch ra
tes of DLC films due to graphitization in the regions exposed to excim
er laser radiation. The patterns delineated in the DLC resist by laser
and oxygen plasma exposure have been transferred into the underlying
silicon substrate by fluorocarbon reactive ion etching with (RIE) the
patterned DLC film acting as an in situ mask. Using this scheme, space
-line patterns 5 mu m wide were made on silicon substrates to demonstr
ate the feasibility of the proposed laser-RIE process for semiconducto
r patterning. The laser fluence required for graphitization is similar
to 100 mJ cm(-2), the O-2 plasma etch rates of the graphitized region
s are higher by a factor of similar to 3.5 and the contrast (gamma) fo
r the DLC resist is 1.1. The use of DLC for submicron resolution warra
nts further investigation.