Perturbed-angular-correlation (PAC) measurements with In-111(EC)Cd-111
probes, implanted at 400 keV into poly- or mono-crystalline Cr2O3, ha
ve been carried out as a function of temperature (290-1370 K). Two dif
ferent electric-field gradients (e.f.g.'s) with identical orientations
in the lattice have been found. Their temperature-dependent variation
s can be well described by a dynamical model which we propose to be co
nnected with a hole trapping at a next-neighbour Cr ion.