GROWTH OF POLYCRYSTALLINE SILICON ON GLASS BY SELECTIVE LASER-INDUCEDNUCLEATION

Citation
D. Toet et al., GROWTH OF POLYCRYSTALLINE SILICON ON GLASS BY SELECTIVE LASER-INDUCEDNUCLEATION, Applied physics letters, 69(24), 1996, pp. 3719-3721
Citations number
19
Categorie Soggetti
Physics, Applied
Journal title
ISSN journal
00036951
Volume
69
Issue
24
Year of publication
1996
Pages
3719 - 3721
Database
ISI
SICI code
0003-6951(1996)69:24<3719:GOPSOG>2.0.ZU;2-P
Abstract
Polycrystalline silicon on glass substrates was grown by a method base d on the creation of nucleation sites using laser crystallization of a morphous silicon followed by thermal annealing at temperatures below 6 00 degrees C. Annealing induces the crystallization of the material ar ound the seeds, eventually leading to coalescence of adjacent domains before spontaneous nucleation sets in. Micro-Raman spectroscopy shows that the seeds experience a tensile stress, which causes a radial bire fringence in the surrounding amorphous silicon, detected by optical an isotropy measurements. We conjecture that this stress facilitates the crystallization of the material around the seed upon thermal annealing . (C) 1996 American Institute of Physics.