HOLLOW ION FORMATION AND DECAY IN SLOW BI46-C-60 COLLISIONS()

Authors
Citation
U. Thumm, HOLLOW ION FORMATION AND DECAY IN SLOW BI46-C-60 COLLISIONS(), Physical review. A, 55(1), 1997, pp. 479-487
Citations number
51
Categorie Soggetti
Physics
Journal title
ISSN journal
10502947
Volume
55
Issue
1
Year of publication
1997
Pages
479 - 487
Database
ISI
SICI code
1050-2947(1997)55:1<479:HIFADI>2.0.ZU;2-P
Abstract
The interaction of slow highly charged ions with many-electron targets leads to the formation of unstable, multiply excited projectiles. We simulated the formation of such hollow ions for slow incident Bi46+ pr ojectiles and C-60 targets. Our semiclassical overbarrier simulation i ncludes resonant exchange and Auger emission of electrons. It models t he dynamical variation of level occupations and charge states during t he collision and predicts highly unstable hollow ions immediately afte r the collision. With respect to the subsequent downstream relaxation of the hollow ions, we propose a simple relaxation scheme that include s autoionizing and radiative transitions. As a consequence of this dow nstream relaxation, almost all of the resonantly captured electrons ar e emitted.