IN-SITU LUMINESCENCE AND IR STUDY OF POROUS SILICON DURING AND AFTER ANODIC-OXIDATION

Citation
Vm. Dubin et al., IN-SITU LUMINESCENCE AND IR STUDY OF POROUS SILICON DURING AND AFTER ANODIC-OXIDATION, Thin solid films, 255(1-2), 1995, pp. 87-91
Citations number
25
Categorie Soggetti
Physics, Applied","Material Science","Physics, Condensed Matter
Journal title
ISSN journal
00406090
Volume
255
Issue
1-2
Year of publication
1995
Pages
87 - 91
Database
ISI
SICI code
0040-6090(1995)255:1-2<87:ILAISO>2.0.ZU;2-K
Abstract
When porous silicon is transferred into a non-fluoride electrolyte and anodically oxidized, the onset of red electroluminescence during anod ic oxidation appears correlated with a decrease in the OH IR absorptio n bands, indicating significant electrolyte removal from the ports. Th e electron states whose population is affected by carrier injection or light excitation have been investigated using in situ electromodulate d or photomodulated IR spectroscopy. The modulated IR absorption of re d-luminescent electro-oxidized porous silicon exhibits an extra absorp tion of localized carriers in the 1000-2500 cm(-1) region, suggesting that the red luminescence occurs through carriers trapped in localized states. The localization process may be efficiently affected by the d ielectric constant of the medium surrounding the silicon nanocrystalli tes.