LOW-TEMPERATURE FATIGUE OF PHOTOLUMINESCENCE IN AGED POROUS SILICON

Citation
V. Grivickas et al., LOW-TEMPERATURE FATIGUE OF PHOTOLUMINESCENCE IN AGED POROUS SILICON, Thin solid films, 255(1-2), 1995, pp. 208-211
Citations number
19
Categorie Soggetti
Physics, Applied","Material Science","Physics, Condensed Matter
Journal title
ISSN journal
00406090
Volume
255
Issue
1-2
Year of publication
1995
Pages
208 - 211
Database
ISI
SICI code
0040-6090(1995)255:1-2<208:LFOPIA>2.0.ZU;2-A
Abstract
We present a photoluminescence (PL) fatigue study at liquid helium tem peratures in mesoporous and microporous silicon (PSi) layers impregnat ed in air. In contrast to PL measurements at room temperature, at low temperatures no recovery of the PL is observed. The results show that the infrared (IR) and slow-luminescent visible (S) band display differ ent behaviors under prolonged illumination. In the S band, similar dep endencies in both kinds of specimens are observed with much stronger f atigue strength on the high energy side, revealing that this band is p ossibly composed of two different kinds of luminescent species. This i dea is further supported by the measured change of the luminescence in tensity and of the non-exponential PL decay at different photon energi es. By analogy with the well-known photo-induced effect in CdSSe micro crystallites, photo-ionization may be responsible for the PL fatigue.