GENERATION AND MOBILITY OF ELECTRONIC CHARGE-CARRIERS IN Y1BA2CU3OX

Authors
Citation
Hi. Yoo et Sm. Lee, GENERATION AND MOBILITY OF ELECTRONIC CHARGE-CARRIERS IN Y1BA2CU3OX, Journal of the American Ceramic Society, 77(12), 1994, pp. 3131-3136
Citations number
24
Categorie Soggetti
Material Science, Ceramics
ISSN journal
00027820
Volume
77
Issue
12
Year of publication
1994
Pages
3131 - 3136
Database
ISI
SICI code
0002-7820(1994)77:12<3131:GAMOEC>2.0.ZU;2-O
Abstract
The Hall effect and the conductivity of Y1Ba2Cu3Ox have been measured together for quenched specimens at room temperature as functions of ox ygen content (x) in the range of 6 < x < 7. It has been reconfirmed th at a hole is generated per every oxygen atom incorporated in the ortho rhombic phase (x > 6.5) and per every two oxygen atoms in the tetragon al phase (x < 6.5). The exothermic enthalpy change for hole generation is 2 times or more larger in the tetragonal than in the orthorhombic phase. The mobility of the majority carrier holes has been found to va ry discontinuously crossing the phase boundary (x similar or equal to 6.5), reflecting a first-order phase transition for these quenched spe cimens. It is independent of oxygen content in each structure: 0.34 +/ - 0.03 cm(2)/(V(.)s) in the tetragonal phase and 0.51 +/- 0.06 cm(2)/( V(.)s) in the orthorhombic phase.