An apparatus is described that is suitable for mechanical characteriza
tion of thin films and metallic coatings at very low loads. In the pre
sent state, penetration depth can be measured, without special precaut
ions, with a resolution of 1 angstrom. The loading electrostatic force
can be varied from 10(-7) N to 0.1 N. The use of piezoelectric actuat
ors allows one to position indentations with an accuracy in the range
of a few nanometres. Owing to its compact design, the present apparatu
s appears highly insensitive to mechanical parasitic vibrations and to
thermal instabilities.