Small-angle neutron scattering (SANS) measurements have been performed
to investigate the nanoscale structure of materials of the systems xT
iO(2) .(1 - x)SiO2 and xZrO(2) .(1 - x)SiO2 with x less than or equal
to 10 mol% at different processing stages. The materials were prepared
by sol-gel processing using the alkoxides under strong acidic conditi
ons. Samples were studied as xerogels heat treated at 120 degrees C an
d 850 degrees C and as wet gels at gel point and after ageing. All sam
ples showed identical microstructure at the gel point of extended line
ar chains about 10 nm long. The aged gel has a mass fractal structure
with fractal dimensions of 1.7-1.9. The 120 degrees C heat-treated xer
ogels show homogeneous oxide regions with mass fractal structure. For
the 850 degrees C heat-treated xerogel the average size of the oxide r
egions is reduced and it has become more dense compared with the 120 d
egrees C heat-treated sample.