CONCENTRATION-DEPTH PROFILING USING TOTAL-REFLECTION X-RAY-FLUORESCENCE SPECTROMETRY IN COMBINATION WITH ION-BEAM MICROSECTIONING TECHNIQUES

Authors
WIENER G MICHAELSEN C KNOTH J SCHWENKE H BORMANN R
Citation
G. Wiener et al., CONCENTRATION-DEPTH PROFILING USING TOTAL-REFLECTION X-RAY-FLUORESCENCE SPECTROMETRY IN COMBINATION WITH ION-BEAM MICROSECTIONING TECHNIQUES, Review of scientific instruments, 66(1), 1995, pp. 20-23
Citations number
18
Categorie Soggetti
Physics, Applied","Instument & Instrumentation
Journal title
Review of scientific instruments → ACNP
ISSN journal
00346748
Volume
66
Issue
1
Year of publication
1995
Part
1
Pages
20 - 23
Database
ISI
SICI code
0034-6748(1995)66:1<20:CPUTX>2.0.ZU;2-F