LOW-TEMPERATURE SCANNING TUNNELING MICROSCOPE FOR BALLISTIC-ELECTRON-EMISSION MICROSCOPY AND SPECTROSCOPY

Citation
Gn. Henderson et al., LOW-TEMPERATURE SCANNING TUNNELING MICROSCOPE FOR BALLISTIC-ELECTRON-EMISSION MICROSCOPY AND SPECTROSCOPY, Review of scientific instruments, 66(1), 1995, pp. 91-96
Citations number
26
Categorie Soggetti
Physics, Applied","Instument & Instrumentation
ISSN journal
00346748
Volume
66
Issue
1
Year of publication
1995
Part
1
Pages
91 - 96
Database
ISI
SICI code
0034-6748(1995)66:1<91:LSTMFB>2.0.ZU;2-I