INVERSION TECHNIQUE TO OBTAIN AN EMISSIVITY PROFILE FROM TANGENTIAL LINE-INTEGRATED HARD X-RAY MEASUREMENTS

Authors
BELL RE
Citation
Re. Bell, INVERSION TECHNIQUE TO OBTAIN AN EMISSIVITY PROFILE FROM TANGENTIAL LINE-INTEGRATED HARD X-RAY MEASUREMENTS, Review of scientific instruments, 66(1), 1995, pp. 558-560
Citations number
5
Categorie Soggetti
Physics, Applied","Instument & Instrumentation
Journal title
Review of scientific instruments → ACNP
ISSN journal
00346748
Volume
66
Issue
1
Year of publication
1995
Part
2
Pages
558 - 560
Database
ISI
SICI code
0034-6748(1995)66:1<558:ITTOAE>2.0.ZU;2-C