STUDY OF SURFACE-STRUCTURE OF CATALYTIC CARBON FILAMENTS BY SECONDARY-ION MASS-SPECTROSCOPY

Authors
IVANOV VP FENELONOV VB AVDEEVA LB GONCHAROVA OV
Citation
Vp. Ivanov et al., STUDY OF SURFACE-STRUCTURE OF CATALYTIC CARBON FILAMENTS BY SECONDARY-ION MASS-SPECTROSCOPY, Reaction kinetics and catalysis letters, 53(1), 1994, pp. 197-203
Citations number
6
Categorie Soggetti
Chemistry Physical
Journal title
Reaction kinetics and catalysis letters → ACNP
ISSN journal
01331736
Volume
53
Issue
1
Year of publication
1994
Pages
197 - 203
Database
ISI
SICI code
0133-1736(1994)53:1<197:SOSOCC>2.0.ZU;2-7
Abstract
The SIMS method has been used for studying the time dependent intensit ies of the secondary ions H2O+, O+, CH3+ and C+ under Ar+ bombardment of two CCF samples with different packing of filaments. The thickness of defect layers is estimated from the median of secondary ions distri bution.