I. Almahamid et al., ELECTRONIC AND STRUCTURAL INVESTIGATIONS OF TECHNETIUM COMPOUNDS BY X-RAY-ABSORPTION SPECTROSCOPY, Inorganic chemistry, 34(1), 1995, pp. 193-198
X-ray absorption near edge structure spectroscopy has been used to est
ablish the chemical shifts of the technetium K edge ina range of compo
unds containing Tc in a variety of formal oxidation states. The edge p
ositions span 19.9 eV from Tc metal to NH4TcO4. Strong correlation bet
ween chemical shift and formal oxidation state is observed. Extended X
-ray absorption fine structure (EXAFS) spectroscopy of Tc-2(CO)(10) in
dicates that multiple scattering along the Tc-C-vector is more importa
nt than direct Tc..O scattering. TcO2 is shown by EXAFS to possess a d
istorted rutile structure with a closest Tc-Tc distance of 2.61 Angstr
om. This is rationalized in terms of the Goodenough model for bonding
in transition metal dioxides.