HIGHER SMECTIC-LAYER ORDER PARAMETERS IN LIQUID-CRYSTALS DETERMINED BY X-RAY-DIFFRACTION AND THE EFFECT OF ANTIFERROELECTRICITY

Authors
TAKANISHI Y IKEDA A TAKEZOE H FUKUDA A
Citation
Y. Takanishi et al., HIGHER SMECTIC-LAYER ORDER PARAMETERS IN LIQUID-CRYSTALS DETERMINED BY X-RAY-DIFFRACTION AND THE EFFECT OF ANTIFERROELECTRICITY, Physical review. E, Statistical physics, plasmas, fluids, and related interdisciplinary topics, 51(1), 1995, pp. 400-406
Citations number
21
Categorie Soggetti
Physycs, Mathematical","Phsycs, Fluid & Plasmas
Journal title
Physical review. E, Statistical physics, plasmas, fluids, and related interdisciplinary topics → ACNP
ISSN journal
1063651X
Volume
51
Issue
1
Year of publication
1995
Pages
400 - 406
Database
ISI
SICI code
1063-651X(1995)51:1<400:HSOPIL>2.0.ZU;2-6