X-RAY REFLECTIVITY STUDY OF INTERFACE ROUGHNESS, STRUCTURE, AND MORPHOLOGY OF ALIGNMENT LAYERS AND THIN LIQUID-CRYSTAL FILMS

Authors
CULL B SHI YS KUMAR S SHIH R MANN J
Citation
B. Cull et al., X-RAY REFLECTIVITY STUDY OF INTERFACE ROUGHNESS, STRUCTURE, AND MORPHOLOGY OF ALIGNMENT LAYERS AND THIN LIQUID-CRYSTAL FILMS, Physical review. E, Statistical physics, plasmas, fluids, and related interdisciplinary topics, 51(1), 1995, pp. 526-535
Citations number
36
Categorie Soggetti
Physycs, Mathematical","Phsycs, Fluid & Plasmas
Journal title
Physical review. E, Statistical physics, plasmas, fluids, and related interdisciplinary topics → ACNP
ISSN journal
1063651X
Volume
51
Issue
1
Year of publication
1995
Pages
526 - 535
Database
ISI
SICI code
1063-651X(1995)51:1<526:XRSOIR>2.0.ZU;2-Z