Several computerized procedures for determination of the axis-angle pa
ir characterizing grain misorientation in bicrystals using Laue patter
ns are described. The procedures are based on the linear least squares
fit method; they are rapid and easy to use. One of the procedures can
be used for determination of single-crystal orientation. It is necess
ary to measure the coordinates of spots and the origin in the referenc
e system of the Laue pattern and find the indices hkl of at least two
spots. Attention is paid to accuracy of determination of the rotation
axis and rotation angle. In favourable cases of orientation, they are
determined with a precision of several minutes of arc.