MULTIPLE-CHARGED SECONDARY-ION EMISSION FROM SILICON AND SILICON-OXIDE BOMBARDED BY HEAVY-IONS AT ENERGIES OF 0.4-10-MEV

Authors
KYOH S TAKAKUWA K SAKURA M UMEZAWA M ITOH A IMANISHI N
Citation
S. Kyoh et al., MULTIPLE-CHARGED SECONDARY-ION EMISSION FROM SILICON AND SILICON-OXIDE BOMBARDED BY HEAVY-IONS AT ENERGIES OF 0.4-10-MEV, Physical review. A, 51(1), 1995, pp. 554-560
Citations number
22
Categorie Soggetti
Physics
Journal title
Physical review. A → ACNP
ISSN journal
10502947
Volume
51
Issue
1
Year of publication
1995
Pages
554 - 560
Database
ISI
SICI code
1050-2947(1995)51:1<554:MSEFSA>2.0.ZU;2-5