X-RAY CRYSTALLOGRAPHY AT EXTREMELY LOW-TEMPERATURES - CHILLING PROTEIN CRYSTALS ENABLES THE CHARACTERIZATION OF TRANSIENT STRUCTURAL INTERMEDIATES

Authors
MOFFAT K
Citation
K. Moffat, X-RAY CRYSTALLOGRAPHY AT EXTREMELY LOW-TEMPERATURES - CHILLING PROTEIN CRYSTALS ENABLES THE CHARACTERIZATION OF TRANSIENT STRUCTURAL INTERMEDIATES, Bio/technology, 13(2), 1995, pp. 133-133
Citations number
6
Categorie Soggetti
Biothechnology & Applied Migrobiology
Journal title
Bio/technology → ACNP
ISSN journal
0733222X
Volume
13
Issue
2
Year of publication
1995
Pages
133 - 133
Database
ISI
SICI code
0733-222X(1995)13:2<133:XCAEL->2.0.ZU;2-W