Ma. Janssen et al., TOPEX POSEIDON MICROWAVE RADIOMETER (TMR) .2. ANTENNA PATTERN CORRECTION AND BRIGHTNESS TEMPERATURE ALGORITHM/, IEEE transactions on geoscience and remote sensing, 33(1), 1995, pp. 138-146
The calibrated antenna temperatures measured by the TOPEX Microwave Ra
diometer are used to derive radiometric brightness temperatures in the
vicinity of the altimeter footprint, The basis for the procedure devi
sed to do this-the antenna pattern correction and brightness temperatu
re algorithm-is described in this paper, along with its associated unc
ertainties, The algorithm is based on knowledge of the antenna pattern
, the ground-based measurements of which are presented along with thei
r analyses, Using the results of these measurements, we perform an err
or analysis that yields the net uncertainties in the derived Th IR foo
tprint brightness temperatures, The net brightness temperature uncerta
inties range from 0.79 to 0.88 degrees K for the three TMR frequencies
, and include the radiometer calibration uncertainties which range fro
m 0.54 to 0.57 degrees K, We also derive an estimate of the uncertaint
y incurred by using brightness temperatures measured in the similar to
40 km TMR footprint to estimate path delay in the similar to 3 km alt
imeter footprint. The RR IS difference in path delay averaged over the
largest TMR footprint relative to that in the altimeter footprint is
estimated to be about 0.3 cm, Finally, we discuss the error associated
with using unequal beams at the three TMR frequencies to derive path
delays, and describe an approach using along-track averaging of the al
gorithm brightness temperatures to reduce this error,