STUDENTS TRAINING FOR AUTOMATIC-GENERATIO N OF COMPONENTS TEST VECTORS

Citation
C. Bouvet et al., STUDENTS TRAINING FOR AUTOMATIC-GENERATIO N OF COMPONENTS TEST VECTORS, Onde electrique, 75(1), 1995, pp. 7-9
Citations number
NO
Categorie Soggetti
Telecommunications,"Engineering, Eletrical & Electronic
Journal title
ISSN journal
00302430
Volume
75
Issue
1
Year of publication
1995
Pages
7 - 9
Database
ISI
SICI code
0030-2430(1995)75:1<7:STFANO>2.0.ZU;2-Z
Abstract
Our aim is to make microelectronic engineering student, themselves fut ure circuit designers, aware of circuit testing by stressing the impor tance of: a. Automatic generation of test patterns by the way of simul ation and design tools. b. Circuit characterisation through : function al tests (searching for stuck at faults), parameter tests (consumption , levels, latch-up), dynamic tests (maximum function frequence). The i mplementation of this practical work involves : A SUN work station per two students VLSI Test System GR115 with emulator The Hilo System sim ulator The SOLO 1400 design tool The Preprocessor GRSpan from GenRad T he software package span-format created at the IXL laboratory.