INTEGRATED-CIRCUIT DESIGN TRAINING AT ENS ERG

Citation
G. Bouvier et al., INTEGRATED-CIRCUIT DESIGN TRAINING AT ENS ERG, Onde electrique, 75(1), 1995, pp. 18-21
Citations number
NO
Categorie Soggetti
Telecommunications,"Engineering, Eletrical & Electronic
Journal title
ISSN journal
00302430
Volume
75
Issue
1
Year of publication
1995
Pages
18 - 21
Database
ISI
SICI code
0030-2430(1995)75:1<18:IDTAEE>2.0.ZU;2-7
Abstract
The test of integrated circuits plays an important role in the integra ted circuit design training at ENSERG. A good design requires a good v erification. We briefly present the practical aspects of integrated ci rcuit design teaching for engineers in electronics who will, or will n ot become microelectronics specialists. All circuits are concerned by testing irrespective of the design methodology : standard cells, gate arrays designed by the students of the second year and the full-custom circuits from the third-year students in microelectronics. These test s require an important preparation work and a perfect mastery of the t ester, that is why the Centre Interuniversitaire Micro-Electronique (C IME) allocates a specialized engineer in this domain to help students and professors. Two testers are available at CIME : Genrad GR125, and Tektronix LV500. We present the flowchart of this teaching practice in order to make it compatible with the knowledge of the two classes and we present the results obtained after several years of practice.