A. Aziz et al., REALIZATION IN CLEAN ROOM AND ELECTRICAL CHARACTERIZATION OF MICROELECTRONIC DEVICES BY DESS STUDENTS, Onde electrique, 75(1), 1995, pp. 22-24
These tutorials are addressed to master, DEA or graduate engineer stud
ents in the intent to apply the electronic, the microelectronic and th
e semiconductors physics Lessons. They relate to the design, the techn
ological realization and the characterization of microelectronic compo
nents. The masks, of the transistors fabricated in the clean room are
designed and developed within the framework of the CNFM. These masks a
re at first presented and then observed by scanning electron microscop
e in order to prepare the work in the clean room. After fabrication, t
he structures are again observed by the scanning electron microscope i
n order to show the fabrication quality and the possible defects and t
hen they are electrically characterized. These different characterizat
ions allow also to compare the physical and electrical parameters of t
he components realized by the students with the industrial ones. This
comparison shows the technological fabrication difficulties.