The electrical properties of C-60-tetracyanoquinodimethane (TCNQ) thin
films fabricated by using an ionized-cluster-beam method in a high va
cuum system were investigated. The films were characterized by transmi
ssion electron microscopy (TEM) and electronic spectroscopy. The spect
roscopic results evidenced the formation of the charge-transfer comple
x system in C-60-TCNQ thin films and the TEM results revealed the micr
ostructure of the films. The film thickness is of about 100 nm. The el
ectromotive intensity at the transition point is a few 10(7) V/m. The
possible mechanism of the electrical phenomena of the films is discuss
ed in the paper.