TEM AND AFM STUDY OF GOLD THIN-FILM NUCLEATION AND GROWTH

Citation
Jc. Arnault et al., TEM AND AFM STUDY OF GOLD THIN-FILM NUCLEATION AND GROWTH, Surface & coatings technology, 71(1), 1995, pp. 45-52
Citations number
11
Categorie Soggetti
Materials Science, Coatings & Films
ISSN journal
02578972
Volume
71
Issue
1
Year of publication
1995
Pages
45 - 52
Database
ISI
SICI code
0257-8972(1995)71:1<45:TAASOG>2.0.ZU;2-P
Abstract
The primary objective of the paper is to compare the results from tran smission electron microscopy (TEM) and atomic force microscopy (AFM) f or the study of morphological parameters of gold clusters deposited on NaCl. Results from both techniques are obtained through an image proc essor and the paper first discusses the inherent inaccuracy of the ima ge treatment. The comparison between the results from the two techniqu es evidences the poor lateral resolution of AFM. Eventually, the two t echniques appear to be complementary and the knowledge of the height o f the clusters from AFM, together with their average size and their de nsity from TEM, allows one to obtain information on their shape.