EFFECT OF CHROMIUM IMPURITY ON DIELECTRIC-RELAXATION EFFECTS OF ZNF2-PBO-TEO2 GLASSES

Citation
Mr. Reddy et al., EFFECT OF CHROMIUM IMPURITY ON DIELECTRIC-RELAXATION EFFECTS OF ZNF2-PBO-TEO2 GLASSES, Indian Journal of Pure & Applied Physics, 33(1), 1995, pp. 48-51
Citations number
NO
Categorie Soggetti
Physics
ISSN journal
00195596
Volume
33
Issue
1
Year of publication
1995
Pages
48 - 51
Database
ISI
SICI code
0019-5596(1995)33:1<48:EOCIOD>2.0.ZU;2-6
Abstract
Dielectric constant (epsilon), loss (tan delta) and conductivity (sigm a) of ZnF2-PbO-TeO2 glasses (of composition 20, 10 and 70 by wt%) are measured as a function of frequency in the range 10(2)-10(7) Hz and in the temperature range 30-200 degrees C. The observations were repeate d for the chromium doped samples (0.04 and 0.06 wt%). The essential di fferences in the dielectric properties are pointed out and explained o n the basis of the point defects created by the glass network modifier s.