Mr. Reddy et al., EFFECT OF CHROMIUM IMPURITY ON DIELECTRIC-RELAXATION EFFECTS OF ZNF2-PBO-TEO2 GLASSES, Indian Journal of Pure & Applied Physics, 33(1), 1995, pp. 48-51
Dielectric constant (epsilon), loss (tan delta) and conductivity (sigm
a) of ZnF2-PbO-TeO2 glasses (of composition 20, 10 and 70 by wt%) are
measured as a function of frequency in the range 10(2)-10(7) Hz and in
the temperature range 30-200 degrees C. The observations were repeate
d for the chromium doped samples (0.04 and 0.06 wt%). The essential di
fferences in the dielectric properties are pointed out and explained o
n the basis of the point defects created by the glass network modifier
s.