SXD SINGLE-CRYSTAL DIFFUSE-SCATTERING - MORE THAN JUST A PRETTY PICTURE

Authors
Citation
Vm. Nield, SXD SINGLE-CRYSTAL DIFFUSE-SCATTERING - MORE THAN JUST A PRETTY PICTURE, Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment, 354(1), 1995, pp. 30-37
Citations number
5
Categorie Soggetti
Nuclear Sciences & Tecnology","Physics, Particles & Fields","Instument & Instrumentation",Spectroscopy
ISSN journal
01689002
Volume
354
Issue
1
Year of publication
1995
Pages
30 - 37
Database
ISI
SICI code
0168-9002(1995)354:1<30:SSD-MT>2.0.ZU;2-B
Abstract
The diffuse scattering from single crystals studied on the SXD single crystal time-of-flight Laue diffractometer provides not only a very be autiful visual image but also a very powerful source of structural inf ormation. Diffuse scattering results from deviations from the average structure, and is often difficult to interpret. No standard method exi sts which is suitable for analysis of the scattering from all crystals . Using the diffuse scattering from ice as an example the single cryst al reverse Monte Carlo technique (RMCX), which is intended to be widel y applicable, is discussed and the type of information obtainable usin g it considered.