Thin films of amorphous InO were produced by thermal vapor deposition
of InO powder in vacuum (P = 10(-5) Torr) at room temperature onto gla
ss substrates. A potential difference in the range of 0-110 V DC was a
pplied to the sample during deposition. The effect of the applied volt
age on the him conductivity was monitored by the current through the h
im. The him mass increase was linearly proportional to the deposition
time (5-6 min). A non-linear increase of the current of several orders
of magnitude was observed. The film resistance was measured in the ra
nge 100-10(8) Omega. To explain the experimental data it was hypothesi
zed that when the voltage across the sample is applied tunneling and p
ercolation are responsible for the growing film conductivity. The vari
ation of the characteristic parameters of tunneling and percolative co
nductance with the applied voltage were derived by fitting the depende
nce of the current on the voltage with analytical expressions correspo
nding to tunneling conductance al the initial phase of the coating pro
cess, followed by percolative conductance. It was found that the trans
ition from tunneling conductance to percolative conductance takes plac
e at earlier times as a function of the applied voltage, and that the
critical percolation exponent increases with the applied voltage.