Polycrystalline beta-SiC, with grain size up to 1500 Angstrom, has bee
n room-temperature-deposited on Si substrates by electron cyclotron re
sonance chemical vapor deposition. Microwave power and the hydrogen ca
rrier gas are the key parameters to lower the deposition temperature.
According to the results of the cross-sectional transmission electron
microscopy, the grain size appeared to be in the same scale as that de
posited at 500 degrees C while a large amount of plasma-induced defect
s were observed in the Si substrate for the room-temperature-deposited
samples. Hence, a CH4-plasma treatment prior to the beta-SiC film gro
wth was adopted, forming a SiC-like interfacial layer to suppress the
substrate damages. (C) 1997 American Institute of Physics.