DEPOSITION OF POLYCRYSTALLINE BETA-SIC FILMS ON SI SUBSTRATES AT ROOM-TEMPERATURE

Citation
Kl. Cheng et al., DEPOSITION OF POLYCRYSTALLINE BETA-SIC FILMS ON SI SUBSTRATES AT ROOM-TEMPERATURE, Applied physics letters, 70(2), 1997, pp. 223-225
Citations number
12
Categorie Soggetti
Physics, Applied
Journal title
ISSN journal
00036951
Volume
70
Issue
2
Year of publication
1997
Pages
223 - 225
Database
ISI
SICI code
0003-6951(1997)70:2<223:DOPBFO>2.0.ZU;2-O
Abstract
Polycrystalline beta-SiC, with grain size up to 1500 Angstrom, has bee n room-temperature-deposited on Si substrates by electron cyclotron re sonance chemical vapor deposition. Microwave power and the hydrogen ca rrier gas are the key parameters to lower the deposition temperature. According to the results of the cross-sectional transmission electron microscopy, the grain size appeared to be in the same scale as that de posited at 500 degrees C while a large amount of plasma-induced defect s were observed in the Si substrate for the room-temperature-deposited samples. Hence, a CH4-plasma treatment prior to the beta-SiC film gro wth was adopted, forming a SiC-like interfacial layer to suppress the substrate damages. (C) 1997 American Institute of Physics.