We have observed strong room-temperature electroluminescence at 1.54 m
u m induced by erbium ions in amorphous hydrogenated silicon (a-Si:H).
The device consisted of an Al/a-Si:H(Er)/n-c-Si/Al structure. A mecha
nism for electronic excitation of the erbium ions in the amorphous mat
rix is proposed that is based on defect-related Auger excitation. (C)
1997 American Institute of Physics.