ON THE EXPONENTIAL VALUE OF LABELED SAMPLES

Citation
V. Castelli et Tm. Cover, ON THE EXPONENTIAL VALUE OF LABELED SAMPLES, Pattern recognition letters, 16(1), 1995, pp. 105-111
Citations number
18
Categorie Soggetti
Computer Sciences, Special Topics","Computer Science Artificial Intelligence
Journal title
ISSN journal
01678655
Volume
16
Issue
1
Year of publication
1995
Pages
105 - 111
Database
ISI
SICI code
0167-8655(1995)16:1<105:OTEVOL>2.0.ZU;2-J
Abstract
Consider the problem of classifying a sample X(0) into one of two clas ses, using a training set Q. Let Q be composed of l labeled samples {( X(1), theta(1)), ..., (X(l), theta(l))} and u unlabeled samples {X'(1) , ..., X'(u)}, where the labels theta(i) are i.i.d. Bernoulli(eta) ran dom variables over the set {1, 2}, the observations {X(i)}(l)(i=1) are distributed according to f(theta i)(.) and the unlabeled observations {X'(j)}(u)(j=l) are independently distributed according to the mixtur e density f(X')(.) = nf(1)(.)+(1-eta)f(.). We assume that f(1)(.), f(2 )(.) and eta are all unknown. Let f(1)(.) and f(2)(.) belong to a know n family F, and assume that the mixtures of elements of F are identifi able. Even when the number of unlabeled samples is infinite and the de cision regions can therefore be identified, one still needs labeled sa mples to label the decision regions with the correct classification. L etting R(l, u) denote the optimal probability of error for l labeled a nd u unlabeled samples, and assuming that the pairwise mixtures of F a re identifiable, we obtain the obvious statements R(0, u)=R(0, infinit y) = 1 /2, R(1, 0) less than or equal to 2 eta eta, R(infinity, u) =R , and then prove R(1, infinity) = 2R(1-R*), where R* is the Bayes pro bability of error, and R(l, infinity) = R+exp{-alpha l+o(l)}, where t he exponent alpha is given by -log(2 root eta eta integral root f(1)(x )f(2)(x)dx). Thus the first labeled sample reduces the risk from 1/2 t o 2R(1-R*) and subsequent labeled samples in the training set reduce the probability of error exponentially fast to the Bayes risk.