X-RAY-INVESTIGATIONS ON THE DEFECT STRUCTURE OF KCL WITH CD++ IMPURITIES

A systematic defect characterization by X-ray diffraction was carried out on crystalline KCl system with Cd++ impurities at various levels, viz. 2, 4, 6, 8, and 10 mole%. Quantitative estimation of the amount a nd nature of defects was done from the integrated X-ray intensity meas urements of the samples. Further analyses of the experimental data ind icate enhancement of the Debye-Waller factor with concentration of Cd+ impurities. The measured density and the cell constant values at roo m temperature yield vacancy estimations for the system. The observed c hange of Bravais lattice of the system for Cd++ concentrations from 4 mole% with appreciable enhancement of intensity of Bragg reflections o f mixed indices are reported and discussed.