FREQUENCY-ANALYSIS OF REFLECTION HIGH-ENERGY ELECTRON-DIFFRACTION INTENSITY OSCILLATIONS DURING MOLECULAR-BEAM EPITAXIAL-GROWTH OF GAAS ON NOMINALLY ORIENTED (111)B SUBSTRATES

Authors
GARCIA BJ FONTAINE C MUNOZYAGUE A
Citation
Bj. Garcia et al., FREQUENCY-ANALYSIS OF REFLECTION HIGH-ENERGY ELECTRON-DIFFRACTION INTENSITY OSCILLATIONS DURING MOLECULAR-BEAM EPITAXIAL-GROWTH OF GAAS ON NOMINALLY ORIENTED (111)B SUBSTRATES, Applied physics letters, 66(5), 1995, pp. 610-612
Citations number
18
Categorie Soggetti
Physics, Applied
Journal title
Applied physics letters → ACNP
ISSN journal
00036951
Volume
66
Issue
5
Year of publication
1995
Pages
610 - 612
Database
ISI
SICI code
0003-6951(1995)66:5<610:FORHEI>2.0.ZU;2-N