Biaxial creep behaviors of stress-relieved and recrystallized thin-wal
led tubing of Ti-3Al-2.5V and Zircaloy-4 are considered under equal ho
op and axial stresses by internal pressurization superimposed with axi
al load. Both hoop and axial strains were monitored and the ratio of t
he strain rate along the hoop to that along the axial directions is co
nsidered to represent rite degree of anisotropy. In both of these allo
ys, relatively weak hoop direction in cold-worked stress-relieved (CWS
R) materials became slightly stronger following recrystallization. Cry
stallographic texture was considered in terms of x-ray pole figures fr
om which the crystallite orientation distribution Junctions (CODFs) we
re derived and crystal plasticity model with slip dominant on prism pl
anes was combined with the CODFs to predict the creep anisotropy. Whil
e good correlation was noted for recrystallized materials, distinct de
viations ave observed for CWSR that are believed to arise from grain s
hape anisotropy. The relatively small (equiaxed) grain size along the
hoop and radial directions results in grain boundary sliding leading t
o stress enhancements along these directions. This anisotropy in grain
boundary sliding is shown to explain the observed deviations.