POSITRON DOPPLER BROADENING MEASUREMENTS WITH A LINAC-BASED SLOW POSITRON BEAM

Authors
SEGERS D PARIDAENS J VANHOECKE T DAUWE C DORIKENSVANPRAET L QUAEYHAEGENS C STALS LM
Citation
D. Segers et al., POSITRON DOPPLER BROADENING MEASUREMENTS WITH A LINAC-BASED SLOW POSITRON BEAM, Applied surface science, 85(1-4), 1995, pp. 172-177
Citations number
8
Categorie Soggetti
Physics, Condensed Matter","Chemistry Physical","Materials Science, Coatings & Films
Journal title
Applied surface science → ACNP
ISSN journal
01694332
Volume
85
Issue
1-4
Year of publication
1995
Pages
172 - 177
Database
ISI
SICI code
0169-4332(1995)85:1-4<172:PDBMWA>2.0.ZU;2-Q
Abstract
All the LINAC-based slow positron beams are pulsed. In order to perfor m Doppler broadening measurements one needs a continuous distribution of the slow positron intensity. This intensity has to be kept as const ant as possible. A smearing out of the positron intensity with a Penni ng trap is described. The first depth profiling results are presented.