R. Xu et Je. Indacochea, REACTION LAYER CHARACTERIZATION OF THE BRAZE JOINT OF SILICON-NITRIDETO STAINLESS-STEEL, Journal of materials engineering and performance, 3(5), 1994, pp. 596-605
This investigation studies the role of titanium in the development of
the reaction layer in braze joining silicon nitride to stainless steel
using titanium-active copper-silver filler metals. This reaction laye
r formed as a result of titanium diffusing to the filler metal/silicon
nitride interface and reacting with the silicon nitride to form the i
ntermetallics, titanium nitride (TiN) and titanium silicide (Ti5Si3).
This reaction layer, as recognized in the literature, allows wetting o
f the ceramic substrate by the molten filler metal. The reaction layer
thickness increases with temperature and time. Its growth rate obeys
the parabolic relationship. Activation energies of 220.1 and 210.9 kJ/
mol were calculated for growth of the reaction layer for the two filte
r metals used. These values are close to the activation energy of nitr
ogen in TIN (217.6 kJ/mol). Two filler metals were used in this study,
Ticusil(68.8 wt% Ag, 26.7 wt% Cu, 4.5 wt% Ti) and CB4 (70.5 wt% Ag, 2
6.5 wt% Cu, 3.0 wt% Ti). The joints were processed in vacuum at temper
atures of 840 to 900 degrees C at various times. Bonding strength is a
ffected by reaction layer thickness in the absence of Ti-Cu intermetal
lics in the filler metal matrix.