ELECTRICAL AND OPTICAL CHARACTERIZATION OF NANOSTRUCTURES

The characterization of nanostructures is a topic of vital interest, s ince the dimensions of commercially available semiconductor devices ar e now in a range, where quantum size effects become evident. In this p aper, various methods are presented to characterize low-dimensional st ructures. Magnetic depopulation, tunneling, far infrared transmission, photo-conductivity and magnetophonon resonances are used to determine the low-dimensional subband energies. For each method, the special fe atures are discussed and it is demonstrated that the different methods yield different, complementary information.