CVD DIAMOND FILMS QUALITY CHARACTERIZATION BY ESR, SEM AND RAMAN-SPECTROSCOPY

Citation
K. Fabisiak et al., CVD DIAMOND FILMS QUALITY CHARACTERIZATION BY ESR, SEM AND RAMAN-SPECTROSCOPY, Acta Physica Polonica. A, 87(1), 1995, pp. 145-149
Citations number
9
Categorie Soggetti
Physics
Journal title
ISSN journal
05874246
Volume
87
Issue
1
Year of publication
1995
Pages
145 - 149
Database
ISI
SICI code
0587-4246(1995)87:1<145:CDFQCB>2.0.ZU;2-V
Abstract
Polycrystalline diamond films were deposited by electron assisted hot filament chemical vapor deposition method on (001) Si substrate using a mixture of propane-butane and hydrogen as working gas. In morphology investigation of diamond films using scanning electron microscope, it was found that diamond film morphology is changing from (111), for hy drocarbon concentration below 0.5 vol.%, via (100) to the so-called '' ball-like'' structure. The diamond film quality and defect structures in it were investigated by Raman and electron spin resonance spectrosc opy for the purpose of obtaining basic knowledge which will aid the gr owth of defect free epitaxial diamond film for electronic and optical applications.