DIAGNOSTICS OF DENSITY-FLUCTUATIONS BY ENHANCED SCATTERING WITH FREQUENCY-TUNABLE MICROWAVE SOURCES

Citation
O. Dumbrajs et al., DIAGNOSTICS OF DENSITY-FLUCTUATIONS BY ENHANCED SCATTERING WITH FREQUENCY-TUNABLE MICROWAVE SOURCES, International journal of infrared and millimeter waves, 16(1), 1995, pp. 307-315
Citations number
9
Categorie Soggetti
Engineering, Eletrical & Electronic","Physics, Applied",Optics
ISSN journal
01959271
Volume
16
Issue
1
Year of publication
1995
Pages
307 - 315
Database
ISI
SICI code
0195-9271(1995)16:1<307:DODBES>2.0.ZU;2-J
Abstract
The enhanced scattering diagnostics method based on the scattering of microwaves close to the upper hybrid resonance in the plasma has a hig h sensitivity and spatial resolution and makes it possible to observe the plasma density fluctuations with characteristic scale-lengths much smaller than the wavelength of the probing radiation in vacuum. Good spatial resolution for spatial positioning of the scattering volume by fast tuning of the source frequency +/-5% around the reference freque ncy in the range 100 - 300 GHz; at high power makes this diagnostic me thod particularly suitable for fluctuation and high energy particle me asurements in tokamak plasmas with relatively flat density and tempera ture profiles.