SCANNING THERMAL IMAGING MICROSCOPY USING COMPOSITE CANTILEVER PROBES

Authors
NAKABEPPU O CHANDRACHOOD M WU Y LAI J MAJUMDAR A
Citation
O. Nakabeppu et al., SCANNING THERMAL IMAGING MICROSCOPY USING COMPOSITE CANTILEVER PROBES, Applied physics letters, 66(6), 1995, pp. 694-696
Citations number
12
Categorie Soggetti
Physics, Applied
Journal title
Applied physics letters → ACNP
ISSN journal
00036951
Volume
66
Issue
6
Year of publication
1995
Pages
694 - 696
Database
ISI
SICI code
0003-6951(1995)66:6<694:STIMUC>2.0.ZU;2-#