The surface compositions of poly(methylphenylsiloxane) (PMPS) homopoly
mers and poly(methylphenylsiloxane) - polystyrene (PMPS-PS) diblock co
polymers have been analyzed using time-of-flight secondary ion mass sp
ectrometry (TOFSIMS). The high surface sensitivity of this method, whi
ch probes samples to depths of a few Angstroms, showed the block copol
ymer samples to have both poly(methylphenylsiloxane) and polystyrene s
egments present at the surface. These results may be contrasted with t
he behavior seen for poly(dimethylsiloxane) (PDMS) blocks and blends,
where the low surface energy of the -[O-Si(CH3)(2)]- repeat units typi
cally leads to surface segregation and complete PDMS surface coverage
is seen. Investigation of the thermal characteristics of the block cop
olymers by differential scanning calorimetry revealed a single glass t
ransition temperature, indicating a single phase morphology. The surfa
ces of the block copolymers also showed an enrichment of -Si(CH3)(3) g
roups, which are the terminal groups of the PMPS, presumably due to th
e low surface energy of the trimethylsilyl groups.