SECONDARY-ION MASS-SPECTROSCOPY (SIMS) IN THE ANALYSIS OF ELEMENTAL MICROPATTERNS IN TREE-RINGS

Authors
MARTIN RR SYLVESTER T BIESINGER MC
Citation
Rr. Martin et al., SECONDARY-ION MASS-SPECTROSCOPY (SIMS) IN THE ANALYSIS OF ELEMENTAL MICROPATTERNS IN TREE-RINGS, Canadian journal of forest research, 24(11), 1994, pp. 2312-2313
Citations number
5
Categorie Soggetti
Forestry
Journal title
Canadian journal of forest research → ACNP
ISSN journal
00455067
Volume
24
Issue
11
Year of publication
1994
Pages
2312 - 2313
Database
ISI
SICI code
0045-5067(1994)24:11<2312:SM(ITA>2.0.ZU;2-H
Abstract
Secondary ion mass spectroscopy (SIMS) has been used to examine elemen tal micropatterns in tree rings. Elevated potassium was detected in di screte rings, suggesting that this technique may have a wide applicati on in dendrochronology.