VARIATION OF SECONDARY-ELECTRON YIELD IN THE FRACTURED SURFACE OF MELT-TEXTURED GROWTH YBCO SUPERCONDUCTOR WITH Y2BACUO5 GRAINS UNDER A SCANNING ELECTRON-MICROSCOPE IN THE TEMPERATURE-RANGE 81-300-K

Authors
CHOW JCL FUNG PCW
Citation
Jcl. Chow et Pcw. Fung, VARIATION OF SECONDARY-ELECTRON YIELD IN THE FRACTURED SURFACE OF MELT-TEXTURED GROWTH YBCO SUPERCONDUCTOR WITH Y2BACUO5 GRAINS UNDER A SCANNING ELECTRON-MICROSCOPE IN THE TEMPERATURE-RANGE 81-300-K, Journal of materials science letters, 14(2), 1995, pp. 99-101
Citations number
11
Categorie Soggetti
Material Science
Journal title
Journal of materials science letters → ACNP
ISSN journal
02618028
Volume
14
Issue
2
Year of publication
1995
Pages
99 - 101
Database
ISI
SICI code
0261-8028(1995)14:2<99:VOSYIT>2.0.ZU;2-F